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Scanning NV Microscope
The Scanning NV Microscope is a quantum precision measurement instrument that combines optically detected magnetic resonance (ODMR) of diamond nitrogen-vacancy centers with scanning probe technique. It is applicable to research in spintronics, multiferroics, 2D magnetic materials, superconductors, and more.
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EASY-G 1310M Gas Pycnometer
The EASY-G 1310M gas pycnometer delivers ±0.02% accuracy and ±0.01% repeatability in true density measurement. Features 3-sample chambers, 13.3" embedded computer, integrated pipeline system, and dual-pressure modes (negative/positive). Ideal for powders, batteries, coal, soil, and food, with rapid industrial QC capabilities.
EASY-G 1310M Gas Pycnometer High-Precision True Density Analyzer with Multi-Sample Chamber True density analyzerSend Email Details -
Specific Surface & Porosimetry Analyzer EASY-V
The EASY-V series products adopt the static volume method for specific surface testing and pore size analysis. They have been delivered to multiple universities and research institutions worldwide and are well-received by users. The series is fully automated, with a user-friendly and easy-to-learn interface. The technology has obtained several international certifications and reaches world-class levels. Its high cost-performance effectively ensures user investment interests, and flexible product configuration meets diverse user needs.
Specific Surface & Porosimetry Analyzer EASY-V Specific surface area analyzer Pore size distribution measurementSend Email Details -
Climber Series Specific Surface & Porosimetry Analyzer
The Climber Series Specific Surface Area and Pore Size Analyzers are designed for fast, accurate, and stable testing, supporting up to 6 samples analyzed simultaneously. Key capabilities include: Testing specific surface area and pore size distribution of solids, slurries, and powders. Specific surface area analysis starting from 0.0005 m²/g. Pore size analysis ranging from 0.35–500 nm (2–500 nm precise analysis; 0.35–2 nm routine analysis). Completion of a five-point BET test within 20 minutes.
Climber Series Specific Surface & Porosimetry Analyzer Dual-module independent control analyzer Battery material analysis equipmentSend Email Details -
W900 W-Band High-Frequency EPR Spectrometer
The W900 operates at 94 GHz for superior spectral and orientational resolution in disordered systems. It features a W-band microwave bridge (93.5–94.5 GHz, 30 mW CW/2 W pulse), a 6-free superconducting magnet with ±1000 Gauss scan coils, and a high-Q resonator (≥4000 Q-value, 93.7–94.4 GHz). Paired with EPR ProCT software for automated CW/pulsed experiments (DEER/EDNMR/ENDOR), it enables precise quantum material and radical analysis.
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EPR Series Spectrometers & Resonators
The EPR Series combines X-band CW (EPR300) and pulsed (EPR100) spectrometers with advanced resonators (PW-4201-DR, High-Q, Dual-Mode). EPR100 delivers 200mW CW/pulsed power, 500W SSPA, and 4ns timing resolution; EPR300 offers 10,000:1 SNR and Q-band extension. Resonators feature 400MHz FWHM (PW-4201-DR), ≥18,000 Q-factor (High-Q), and dual-mode frequencies. Ideal for materials science, chemistry, and quantum research with automated workflows and multi-nucleus detection.
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CAN400 Intelligent Liquid-State NMR Spectrometer
The CAN400 features a 9.39 Tesla 400 MHz superconducting magnet with 54 mm bore for ultra-high homogeneity. Its distributed console supports 2–8 RF channels, 4 ns timing resolution, and software-controlled power management. Equipped with a 72-slot auto sample changer, intelligent touchscreen, and multi-nucleus probe, it enables rapid, automated analysis. Ideal for chemistry, energy, and pharma, it offers in-situ experiments, remote access, and versatile applications from battery research to drug screening.
CAN400 Intelligent Liquid-State NMR Spectrometer 400 MHz superconducting magnet Distributed console NMRSend Email Details -
SEM-X Series Ultra-High Resolution Schottky Field Emission Scanning Electron Microscope
The SEM-X Series delivers breakthrough resolution (0.6nm@15kV, 1.2nm@1kV) with low-voltage imaging, minimizing sample damage. It integrates "Super-Tunnel" electron optics, electrostatic-electromagnetic compound lenses, and dual-beam deceleration technology for aberration-free performance. Features include low-vacuum mode (10-180Pa), 8-inch compatible loadlock, and multi-detector systems (UD-SE/BSE, LD, LVD) for versatile analysis. Ideal for semiconductor, materials science, and life sciences, offering automation and expandability forsearch applications.
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DB550 Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope
The DB550 integrates a Ga+ Focused Ion Beam (FIB) column with a Field Emission SEM, featuring "Super Tunnel" electron optics (low aberration, magnetic-free lens), 3nm@30kV ion resolution, and 0.9nm@15kV SEM resolution. It includes a nanomanipulator (≤10nm precision), gas injection system (single GIS, ±0.1°C temp control), and 8-inch compatible loadlock. Ideal for nano-fabrication, semiconductor failure analysis, and materials characterization with automated workflows and expandable detectors (EDS/EBSD/STEM).
DB550 Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope Integrated FIB-SEM workstation Super Tunnel electron opticsSend Email Details -
Field Emission Transmission Electron Microscope
TH120 120kV Field Emission TEM integrates Schottky emission gun, parallel/convergent beam auto - switch, symmetric obj. lens. Features high - res CMOS cam, 4 - axis stage, integrated software. Divided workspaces cut interference; automated workflows boost efficiency; upgrade - ready design suits diverse R&D needs.
Field Emission Transmission ElectronMicroscope 120kV Field Emission Transmission Microscope TH120 Advanced Lab Imaging SolutionSend Email Details -
HEM6000 High-Speed Scanning Electron Microscope
High - speed Scanning Driver Dwell time: 10 ns/pixel; Maximum acquisition speed: 2×100M pixel/s Electron Filtering System SE/BSE signals can be freely switched, and the mixing ratio of signals is adjustable. All - electrostatic High - speed Deflection System It can realize high - resolution large - field mode. With 4 nm pixel size, the maximum field of view reaches 32 μm×32 μm. Sample Stage Deceleration Technology It reduces the landing voltage of incident electrons and simultaneously improves the collection efficiency of recycled electrons. Immersion Electromagnetic Compound Objective Lens The objective lens magnetic field immerses the sample, achieving low aberration and high resolution.
HEM6000 High-Speed Scanning Electron Microscope Industrial SEM for Semiconductor Inspection Low-Voltage High-Resolution SEMSend Email Details
