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HEM6000 High-Speed Scanning Electron Microscope
High - speed Scanning Driver Dwell time: 10 ns/pixel; Maximum acquisition speed: 2×100M pixel/s Electron Filtering System SE/BSE signals can be freely switched, and the mixing ratio of signals is adjustable. All - electrostatic High - speed
HEM6000 High-Speed Scanning Electron Microscope Industrial SEM for Semiconductor Inspection Low-Voltage High-Resolution SEMSend Email Details -
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DB550 Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope
The DB550 integrates a Ga+ Focused Ion Beam (FIB) column with a Field Emission SEM, featuring "Super Tunnel" electron optics (low aberration, magnetic-free lens), 3nm@30kV ion resolution, and 0.9nm@15kV SEM resolution. It includes a nanomanipulator (≤10nm precision), gas injection system (single GIS, ±0.1°C temp control), and 8-inch compatible loadlock. Ideal for nano-fabrication, semiconductor failure analysis, and materials characterization with automated workflows and expandable detectors (EDS/EBSD/STEM).
DB550 Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope Integrated FIB-SEM workstation Super Tunnel electron opticsSend Email Details
