C-SAM/SAT (Scanning Acoustic Microscope)
  • C-SAM/SAT (Scanning Acoustic Microscope)

C-SAM/SAT (Scanning Acoustic Microscope)

C-SAM/SAT delivers non-destructive ultrasound imaging with 5–500MHz bandwidth, 1200mm/s scan speed, and multi-mode operation (manual/semi-auto/auto). SAM Auto Line enables automated defect detection (voids, delamination) for IGBT/MEMS, featuring pallet circulation, auto-review software, and robotic handling—ensuring precise, efficient quality control for semiconductors and medical devices.

C-SAM/SAT (Scanning Acoustic Microscope)

Product Details 

The C-SAM/SAT (Scanning Acoustic Microscope), developed by SBT, revolutionizes non-destructive quality control for opaque materials in semiconductors, medical devices, and advanced manufacturing. With the tagline "Making Quality Visible," it uses high-frequency ultrasound to visualize internal defects like voids, bubbles, inclusions, and delamination.

C-SAM/SAT (Scanning Acoustic Microscope)

Technical Specifications:

  • Physical Dimensions: Unit size 1100mm×1020mm×1550mm; sink size 645mm×750mm×155mm.

  • Scanning Performance: Effective range 400mm×320mm×120mm; max speed 1200mm/s; recommended resolution 1–4000μm.

  • Core Tech: 5–500MHz emission/reception bandwidth, 1GHz/s DAQ sampling, and integrated water-wastewater system for stable operation.

  • Flexibility: Supports manual, semi-automatic, and automatic (online) loading modes.

Model Variations:

  • SAM Line: Standard model for versatile inspection needs.

  • SAM Auto Line: Advanced automated version featuring a light-gray body with blue accents, transparent front panels, and internal robotic arms for pallet handling. Its workflow includes Loading → Scanning (US600 ultrasonic system) → Unloading → Pallet Circulation, enabling continuous operation.

Applications: Widely used for IGBT/MOSFET modules, heatsinks, chips, polycrystalline diamond compacts, ceramics, and MEMS. The SAM Auto Line excels in IGBT inspection, bond checking, and MEMS analysis, with an automatic defect-review software package that evaluates entire modules, reducing human error.

Scanning Acoustic Microscope

Advantages: Combines high resolution (sub-micron defect detection) with rapid scanning, ensuring compliance with strict industry standards. Its modular design adapts to diverse production lines, while the automated SAM Auto Line boosts throughput by 30% versus manual systems.

SEO Keywords

Scanning Acoustic Microscope, C-SAM/SAT, SAM Auto Line, automated inspection, non-destructive testing, ultrasound inspection, defect detection, IGBT inspection, MEMS inspection, bond checking, ultrasonic scanning, pallet circulation, semiconductor quality control, medical device QC, void detection, delamination analysis


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