-
Hot
C-SAM SAT Scanning Acoustic Microscope for Semiconductor Inspection
C-SAM/SAT delivers non-destructive ultrasound imaging with 5–500MHz bandwidth, 1200mm/s scan speed, and multi-mode operation (manual/semi-auto/auto). SAM Auto Line enables automated defect detection (voids, delamination) for IGBT/MEMS, featuring pallet circulation, auto-review software, and robotic handling—ensuring precise, efficient quality control for semiconductors and medical devices.
C-SAM SAT Scanning Acoustic Microscope for Semiconductor Inspection Scanning Acoustic Microscope automated inspectionSend Email Details
