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AX9500 Vision Series 3D Offline Inspection System
The AX9500 Vision Series offers advanced 3D offline inspection with 160kV open X-ray source, ≤1μm resolution, and 2500X magnification. Featuring 7-axis motion, PCT/ACT scanning, and automated navigation software for bubble measurement and defect analysis. Supports BGA, automotive parts, new energy components, and ceramics. Safety-com with <0.5μSv/h radiation, emergency stop buttons, and dual scanning modes (ACT/PCT). Ideal for high-accuracy quality control in electronics, manufacturing, and special industries.
High-Precision Industrial X-Ray CT Detection Solution automotive parts defect detection high-resolution X-ray CTSend Email Details -
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AX7900 Industrial X-Ray CT Inspection System
The AX7900 delivers exceptional precision with 5μm focal spot size, 600X magnification, and 90kV tube voltage. Its high-definition FPD detector (1536×1536 pixels) enables automated void analysis for BGA/QFN components, CNC-driven scanning, and real-time data display. CE-certified with <1μSv/h radiation safety, it supports geometric measurements and fingerprint-secured access. Ideal for PCB, semiconductor, and assembly inspection, combining efficiency (10-30Hz frame rate) with reliability in a compact footprint (1800×1400×1800mm).
AX7900 Industrial X-Ray CT Inspection System High-Precision Non-Destructive Testing for Electronic ComponentsSend Email Details -
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C-SAM SAT Scanning Acoustic Microscope for Semiconductor Inspection
C-SAM/SAT delivers non-destructive ultrasound imaging with 5–500MHz bandwidth, 1200mm/s scan speed, and multi-mode operation (manual/semi-auto/auto). SAM Auto Line enables automated defect detection (voids, delamination) for IGBT/MEMS, featuring pallet circulation, auto-review software, and robotic handling—ensuring precise, efficient quality control for semiconductors and medical devices.
C-SAM SAT Scanning Acoustic Microscope for Semiconductor Inspection Scanning Acoustic Microscope automated inspectionSend Email Details
