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CIS30-S Intelligent Cleanliness Analysis System
The CIS30-S system revolutionizes cleanliness analysis with intelligent one-click operation, delivering 50% faster analysis speed through single-scan metal/non-metal particle identification. Features patented digital lighting technology, automatic magnification recognition, and compliance with ISO16232/VDA19 standards. Offers automatic threshold setting, customizable reporting, and traceable measurement results with certified reference materials. Ideal for automotive, semiconductor, and precision manufacturing quality control, providing complete particle size, distribution, and 3D topography analysis with laboratory-grade accuracy.
One-Click Automatic Particle Identification & 3D Analysis CIS30-S Intelligent Cleanliness Analysis SystemSend Email Details
