material characterization
  • Specific Surface & Porosimetry Analyzer EASY-V

    Specific Surface & Porosimetry Analyzer EASY-V

    The EASY-V series products adopt the static volume method for specific surface testing and pore size analysis. They have been delivered to multiple universities and research institutions worldwide and are well-received by users. The series is fully automated, with a user-friendly and easy-to-learn interface. The technology has obtained several international certifications and reaches world-class levels. Its high cost-performance effectively ensures user investment interests, and flexible product configuration meets diverse user needs.

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  • Climber Series Specific Surface & Porosimetry Analyzer

    Climber Series Specific Surface & Porosimetry Analyzer

    The Climber Series Specific Surface Area and Pore Size Analyzers are designed for fast, accurate, and stable testing, supporting up to 6 samples analyzed simultaneously. Key capabilities include: Testing specific surface area and pore size distribution of solids, slurries, and powders. Specific surface area analysis starting from 0.0005 m²/g. Pore size analysis ranging from 0.35–500 nm (2–500 nm precise analysis; 0.35–2 nm routine analysis). Completion of a five-point BET test within 20 minutes.

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  • W900 W-Band High-Frequency EPR Spectrometer

    W900 W-Band High-Frequency EPR Spectrometer

    The W900 operates at 94 GHz for superior spectral and orientational resolution in disordered systems. It features a W-band microwave bridge (93.5–94.5 GHz, 30 mW CW/2 W pulse), a 6-free superconducting magnet with ±1000 Gauss scan coils, and a high-Q resonator (≥4000 Q-value, 93.7–94.4 GHz). Paired with EPR ProCT software for automated CW/pulsed experiments (DEER/EDNMR/ENDOR), it enables precise quantum material and radical analysis.

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